Invention Grant
US09324456B2 Self-diagnosing method of a volatile memory device and an electronic device performing the same
有权
易失性存储器件的自诊断方法和执行该易失性存储器件的电子器件
- Patent Title: Self-diagnosing method of a volatile memory device and an electronic device performing the same
- Patent Title (中): 易失性存储器件的自诊断方法和执行该易失性存储器件的电子器件
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Application No.: US14196453Application Date: 2014-03-04
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Publication No.: US09324456B2Publication Date: 2016-04-26
- Inventor: Jae-Sop Kong
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-Si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-Si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2013-0027985 20130315
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G11C29/44 ; G06F11/10 ; G11C29/50 ; G11C29/52 ; G11C29/04
Abstract:
In a self-diagnosing method of a volatile memory device, a processor outputs a self-refresh entrance command and enters a power save mode, and a volatile memory device performs a self-diagnosing operation for a plurality of memory cells in response to the self-refresh entrance command while the processor is in the power save mode.
Public/Granted literature
- US20140281736A1 SELF-DIAGNOSING METHOD OF A VOLATILE MEMORY DEVICE AND AN ELECTRONIC DEVICE PERFORMING THE SAME Public/Granted day:2014-09-18
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