Invention Grant
US09325888B2 Method and light pattern for measuring the height or the height profile of an object
有权
用于测量物体的高度或高度轮廓的方法和光线图案
- Patent Title: Method and light pattern for measuring the height or the height profile of an object
- Patent Title (中): 用于测量物体的高度或高度轮廓的方法和光线图案
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Application No.: US14066407Application Date: 2013-10-29
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Publication No.: US09325888B2Publication Date: 2016-04-26
- Inventor: Burghard Hoffmann , Ingo Tzschichholtz
- Applicant: VITRONIC Dr.—Ing. Stein Bildverarbeitungssysteme GmbH
- Applicant Address: DE Wiesbaden
- Assignee: VITRONIC Dr.-Ing. Stein Bildverarbeitungssyteme GmbH
- Current Assignee: VITRONIC Dr.-Ing. Stein Bildverarbeitungssyteme GmbH
- Current Assignee Address: DE Wiesbaden
- Agency: Dinsmore & Shohl LLP
- Priority: EP12190830 20121031
- Main IPC: G01B11/02
- IPC: G01B11/02 ; H04N5/225 ; G01B11/04 ; G01B11/25 ; G01B11/06

Abstract:
A method for measuring the height of an object, including projecting a light pattern having successive coded picture elements extending in a direction of a transversal axis onto the object by a light source. Each of the picture elements has at least one coding feature and the picture elements together define a code word. The picture element groups from a sequence of a predetermined number of successive picture elements each define individual partial code words, existing exactly once within the code word. Capturing the light pattern by a picture sensor arranged off-set to the light source. Determining the positions of the picture element groups and determining the height of the object the determined position of the picture element groups in comparison to a respective reference position.
Public/Granted literature
- US20140118538A1 METHOD AND LIGHT PATTERN FOR MEASURING THE HEIGHT OR THE HEIGHT PROFILE OF AN OBJECT Public/Granted day:2014-05-01
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