Invention Grant
- Patent Title: LED, testing method and article
- Patent Title (中): LED,测试方法和文章
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Application No.: US14626029Application Date: 2015-02-19
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Publication No.: US09326349B2Publication Date: 2016-04-26
- Inventor: Jörg Niggemeyer
- Applicant: Nucon GbR
- Applicant Address: DE Buchholz
- Assignee: Nucon GbR
- Current Assignee: Nucon GbR
- Current Assignee Address: DE Buchholz
- Agency: Seed IP Law Group PLLC
- Priority: DE202014001507U 20140221; DE102014019434 20141222
- Main IPC: H05B33/08
- IPC: H05B33/08 ; H05B37/00

Abstract:
A Light Emitting Diode (LED) driving circuit includes a reference-voltage terminal, an input terminal to receive a pulse-width modulated (PWM) power signal, and a PWM output terminal. An LED is coupled across the PWM output terminal and the reference-voltage terminal. A measurement capacitor circuit and a voltage-divider network are coupled in parallel with the LED. During an interruption of the PWM power signal, a sense node of the voltage-divider provides a voltage indicative of a temperature of the LED prior to the interruption. The voltage indicative of the temperature is used to control driving of the LED.
Public/Granted literature
- US20150245429A1 LED, TESTING METHOD AND ARTICLE Public/Granted day:2015-08-27
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