Invention Grant
- Patent Title: Testing device for testing dimensions of workpieces
- Patent Title (中): 用于测试工件尺寸的测试装置
-
Application No.: US14554307Application Date: 2014-11-26
-
Publication No.: US09329031B2Publication Date: 2016-05-03
- Inventor: Hua-Jin Lian , Liang Zhang , Zhen-Shan Cui
- Applicant: Fu Tai Hua Industry (Shenzhen) Co., Ltd. , HON HAI PRECISION INDUSTRY CO., LTD.
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201310622205 20131130
- Main IPC: G01B11/02
- IPC: G01B11/02 ; G01B11/30
Abstract:
A testing device includes a positioning mechanism, a testing mechanism, and a controller. The testing device is used for testing lengths, widths, straightness, verticality, flatness, position of the testing points, and other dimensions of a workpiece. The positioning mechanism is used for positioning the workpiece. The testing mechanism is fixed on the positioning mechanism for testing dimensions of the workpiece at one time. The controller is electrically coupled to the testing mechanism for controlling the testing mechanism in use.
Public/Granted literature
- US20150153159A1 TESTING DEVICE Public/Granted day:2015-06-04
Information query
