Invention Grant
- Patent Title: Material screening apparatus
- Patent Title (中): 材料筛选设备
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Application No.: US13812290Application Date: 2010-07-27
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Publication No.: US09329145B2Publication Date: 2016-05-03
- Inventor: Keehoon Kim
- Applicant: Keehoon Kim
- Applicant Address: KR Seoul
- Assignee: Korea Institute of Science and Technology
- Current Assignee: Korea Institute of Science and Technology
- Current Assignee Address: KR Seoul
- Agency: NSIP Law
- International Application: PCT/KR2010/004917 WO 20100727
- International Announcement: WO2012/015077 WO 20120202
- Main IPC: G01K7/00
- IPC: G01K7/00 ; G01N25/20 ; G01N25/18

Abstract:
The present invention relates to a material screening apparatus, and more particularly, to a material screening apparatus that senses temperature change according to the thermal characteristics of the material to be screened so as to extract a thermal characteristic value for the material and determine the type of the material. The material screening apparatus according to an embodiment of the present invention comprises: a plurality of heat generators for variably generating heat; a plurality of temperature sensors attached to the heat generators, respectively, for measuring the changing temperatures of the heat generators; and a controller for controlling the heat generation by the heat generators, performing the calculations of the temperature values measured by the plurality of temperature sensors, and outputting the thermal characteristic value of the material.
Public/Granted literature
- US20130156063A1 MATERIAL SCREENING APPARATUS Public/Granted day:2013-06-20
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