Invention Grant
- Patent Title: Sample processing apparatus and sample processing method
- Patent Title (中): 样品处理装置和样品处理方法
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Application No.: US13230407Application Date: 2011-09-12
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Publication No.: US09329193B2Publication Date: 2016-05-03
- Inventor: Hiromi Onomichi , Mitsuo Yamasaki
- Applicant: Hiromi Onomichi , Mitsuo Yamasaki
- Applicant Address: JP Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Hyogo
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-203143 20100910
- Main IPC: G01N35/04
- IPC: G01N35/04 ; G01N35/10 ; G01N35/00

Abstract:
A sample processing apparatus for performing a process including a plurality of steps on a sample, the sample processing apparatus sequentially processing a plurality of samples, is disclosed. The apparatus comprises a plurality of units corresponding to the respective steps in the process; a transfer section which transfers a sample to the units according to a flow of the steps; and a controller. Specifically, when an operation was not performed successfully, the controller interrupts the process for a sample that had not reached the location where the unsuccessful operation was performed while continuing the process for a sample that had already passed the location, retries the operation that was not performed successfully, and resumes the interrupted process when the retried operation has been performed successfully.
Public/Granted literature
- US20120064638A1 SAMPLE PROCESSING APPARATUS AND SAMPLE PROCESSING METHOD Public/Granted day:2012-03-15
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