Invention Grant
US09329220B2 Method and system for detecting arc faults and flashes using wavelets
有权
使用小波检测电弧故障和闪光的方法和系统
- Patent Title: Method and system for detecting arc faults and flashes using wavelets
- Patent Title (中): 使用小波检测电弧故障和闪光的方法和系统
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Application No.: US14011553Application Date: 2013-08-27
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Publication No.: US09329220B2Publication Date: 2016-05-03
- Inventor: Robert S. Balog
- Applicant: The Texas A&M University System
- Applicant Address: US TX College Station
- Assignee: The Texas A&M University System
- Current Assignee: The Texas A&M University System
- Current Assignee Address: US TX College Station
- Agency: Boisbrun Hofman, PLLC
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/02 ; G01R31/12 ; H02H1/00 ; H02S50/10 ; H02H3/44 ; H02H3/46 ; G06F11/30

Abstract:
A method for detecting an arc event occurring in an electrical system includes sensing a voltage using a voltage sensing device coupled to a component of the electrical system, producing a signal waveform representative of the sensed voltage using the voltage sensing device, and sampling at a predetermined frequency the voltage signal waveform to generate a plurality of sample waveforms. The method further includes applying a wavelet transform to each sample waveform to decompose them into a predetermined number of detailed waveforms using a corresponding number of successive wavelet components, dividing each detailed waveform into a plurality of segments, analyzing the plurality of segments to detect a change in one or more of the properties of the corresponding detailed waveform, and determining an occurrence of the arc event based on the duration of the detected change of one or more of characteristics of the corresponding detailed waveform.
Public/Granted literature
- US20140067291A1 Method and System For Detecting Arc Faults and Flashes Using Wavelets Public/Granted day:2014-03-06
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