Invention Grant
- Patent Title: Prognostic circuit of electromigration failure for integrated circuit
- Patent Title (中): 集成电路电迁移故障预测电路
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Application No.: US14348849Application Date: 2013-06-08
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Publication No.: US09329228B2Publication Date: 2016-05-03
- Inventor: Yiqiang Chen , Yunfei En , Yun Huang , Yudong Lu , Qingzhong Xiao
- Applicant: Fifth Electronics Research Institute of Ministry of Industry and Information Technology
- Applicant Address: CN Guangdong
- Assignee: FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECHONOLY
- Current Assignee: FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECHONOLY
- Current Assignee Address: CN Guangdong
- Agency: Miller, Matthias & Hull LLP
- Priority: CN201210560083 20121220
- International Application: PCT/CN2013/077012 WO 20130608
- International Announcement: WO2014/094413 WO 20140626
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/28 ; G01R31/30

Abstract:
A prognostic circuit of EM failure for IC is disclosed, which includes a current monitoring module, the current monitoring module includes a current output module electrically connected with a monitoring metal wire, and one or more conductive metals covered by an oxide layer and electrically insulated with the monitoring metal wire, the current output module includes at least one current source, the conductive metal is electrically connected with the output port of the current monitoring module, and the monitoring metal wire is surrounded by the conductive metal. The above prognostic circuit can give a warning for short-circuit failure caused by a whisker created by EM. Meanwhile, the prognostic circuit of the present disclosure can also be added a resistance warning, and it can indicate the failure of the resistance increased by EM and the short circuit caused by whisker, so as to greatly increase the warning efficiency of the EM.
Public/Granted literature
- US20140232428A1 Prognostic Circuit of Electromigration Failure for Integrated Circuit Public/Granted day:2014-08-21
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