Invention Grant
- Patent Title: Depth determination in X-ray backscatter system using frequency modulated X-ray beam
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Application No.: US14932942Application Date: 2015-11-04
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Publication No.: US09329300B2Publication Date: 2016-05-03
- Inventor: Steven W. Pauly
- Applicant: Nucsafe, Inc.
- Applicant Address: US TN Oak Ridge
- Assignee: NUCSAFE, INC.
- Current Assignee: NUCSAFE, INC.
- Current Assignee Address: US TN Oak Ridge
- Agency: Luedeka Neely Group, P.C.
- Main IPC: G01N23/203
- IPC: G01N23/203 ; G01V5/00

Abstract:
An X-ray backscatter imaging system uses frequency modulated X-rays to determine depth of features within a target. An X-ray source generates X-ray radiation modulated by a frequency-modulated bias current. The X-ray radiation impinges upon and is backscattered from multiple depths within the target. A scintillating material receives the backscattered X-rays and generates corresponding photons. A photodetector, having gain modulated by the frequency modulation signal from the local oscillator, receives the photons from the scintillating material and generates an analog output signal containing phase delay information indicative of the distance travelled by the X-rays backscattered from multiple depths within the target. The analog output signal is sampled by an analog-to-digital converter to create a digital output signal. A computer processor performs a discrete Fourier transform on the digital output signal to provide target depth information based on the phase delay information.
Public/Granted literature
- US20160070021A1 Depth Determination in X-ray Backscatter System Using Frequency Modulated X-Ray Beam Public/Granted day:2016-03-10
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