Invention Grant
- Patent Title: Method and apparatus for detecting defect of backlight module
- Patent Title (中): 用于检测背光模块缺陷的方法和装置
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Application No.: US14346868Application Date: 2013-05-31
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Publication No.: US09330451B2Publication Date: 2016-05-03
- Inventor: David Yan
- Applicant: BOE OPTICAL SCIENCE AND TECHNOLOGY CO., LTD.
- Applicant Address: CN Suzhou CN Beijing
- Assignee: BOE Optical Science and Technology Co., Ltd,BOE Technology Group Co., Ltd
- Current Assignee: BOE Optical Science and Technology Co., Ltd,BOE Technology Group Co., Ltd
- Current Assignee Address: CN Suzhou CN Beijing
- Agency: Banner & Witcoff, Ltd.
- Priority: CN201310071403 20130306
- International Application: PCT/CN2013/076536 WO 20130531
- International Announcement: WO2014/134880 WO 20140912
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G01M11/08 ; G09G3/00 ; G01N21/88 ; G01N21/95 ; G09G3/34
Abstract:
According to embodiments of the invention, there are disclosed a method and an apparatus for detecting defect of a backlight module. Images that show components in the backlight module are acquired with a plurality of preset angles relative to a surface of the backlight module. The acquired images that show the components in the backlight module are analyzed, so as to determine whether a defect presents in the components in the backlight module.
Public/Granted literature
- US20150063675A1 METHOD AND APPARATUS FOR DETECTING DEFECT OF BACKLIGHT MODULE Public/Granted day:2015-03-05
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