Invention Grant
- Patent Title: Apparatuses and methods for sensing using an integration component
- Patent Title (中): 使用集成组件进行感测的装置和方法
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Application No.: US14458813Application Date: 2014-08-13
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Publication No.: US09330756B2Publication Date: 2016-05-03
- Inventor: Ferdinando Bedeschi
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00
Abstract:
The present disclosure includes apparatuses and methods for sensing a resistance variable memory cell. A number of embodiments include circuitry to provide a programming signal to a memory cell in the array, the programming signal associated with programming the memory cell to a particular data state; and determine, via an integration component, if a data state of the memory cell changes to a different data state responsive to the programming signal being provided.
Public/Granted literature
- US20160049194A1 APPARTUSES AND METHODS FOR SENSING USING AN INTEGRATION COMPONENT Public/Granted day:2016-02-18
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