Invention Grant
- Patent Title: Method for determining a circuit element parameter
- Patent Title (中): 确定电路元件参数的方法
-
Application No.: US13752596Application Date: 2013-01-29
-
Publication No.: US09330875B2Publication Date: 2016-05-03
- Inventor: Riley D. Beck , Kent D. Layton , Matthew A. Tyler , Scott R. Grange
- Applicant: Semiconductor Components Industries, LLC
- Applicant Address: US AZ Phoenix
- Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee Address: US AZ Phoenix
- Agent Rennie William Dover
- Main IPC: H01H83/02
- IPC: H01H83/02 ; H02H3/33 ; H02H3/04 ; G01R31/02

Abstract:
A method for determining a circuit element parameter in a ground fault circuit interrupter circuit. An electrical signal provided to a first node is used to generate another electrical signal at a second node. The electrical signal at the second node is multiplexed with a modulation signal to generate a modulated signal that is then filtered and converted into a digital representation of a portion of the circuit element parameter. The electrical signal at the second node is multiplexed with the modulation signal after it has been phase shifted to produce a modulated signal that is filter and converted into a digital representation of another portion of the circuit element parameter. In another aspect, a slope based solenoid self-test method is used for self-testing in a GFCI circuit. Alternatively, a method for determining a wiring fault is provided using a digital filter.
Public/Granted literature
- US20140210484A1 METHOD FOR DETERMINING A CIRCUIT ELEMENT PARAMETER Public/Granted day:2014-07-31
Information query