Invention Grant
- Patent Title: Semiconductor structure with aspect ratio trapping capabilities
- Patent Title (中): 具有纵横比捕获能力的半导体结构
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Application No.: US13925911Application Date: 2013-06-25
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Publication No.: US09330908B2Publication Date: 2016-05-03
- Inventor: Thomas N. Adam , Kangguo Cheng , Pouya Hashemi , Ali Khakifirooz , Alexander Reznicek
- Applicant: GLOBALFOUNDRIES INC.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Scully Scott Murphy and Presser
- Agent Frank DiGiglio
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/8258 ; H01L21/8238 ; H01L27/088

Abstract:
A semiconductor structure includes a first semiconductor region. The first semiconductor region includes a first semiconductor layer composed of a group IV semiconductor material having a top surface and a back surface. The first semiconductor layer has an opening in the top surface to at least a depth greater than an aspect ratio trapping (ART) distance. The first semiconductor region also has a second semiconductor layer composed of a group III/V semiconductor compound deposited within the opening and on the top surface of the first semiconductor layer. The second semiconductor layer forms an ART region from the bottom of the opening to the ART distance.
Public/Granted literature
- US20140374796A1 SEMICONDUCTOR STRUCTURE WITH ASPECT RATIO TRAPPING CAPABILITIES Public/Granted day:2014-12-25
Information query
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