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US09330908B2 Semiconductor structure with aspect ratio trapping capabilities 有权
具有纵横比捕获能力的半导体结构

Semiconductor structure with aspect ratio trapping capabilities
Abstract:
A semiconductor structure includes a first semiconductor region. The first semiconductor region includes a first semiconductor layer composed of a group IV semiconductor material having a top surface and a back surface. The first semiconductor layer has an opening in the top surface to at least a depth greater than an aspect ratio trapping (ART) distance. The first semiconductor region also has a second semiconductor layer composed of a group III/V semiconductor compound deposited within the opening and on the top surface of the first semiconductor layer. The second semiconductor layer forms an ART region from the bottom of the opening to the ART distance.
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