Invention Grant
US09331012B2 Method for fabricating a physical unclonable interconnect function array
有权
用于制造物理不可克隆互连功能阵列的方法
- Patent Title: Method for fabricating a physical unclonable interconnect function array
- Patent Title (中): 用于制造物理不可克隆互连功能阵列的方法
-
Application No.: US13414825Application Date: 2012-03-08
-
Publication No.: US09331012B2Publication Date: 2016-05-03
- Inventor: Kai D. Feng , Wai-Kin Li , Ping-Chuan Wang , Zhijian Yang
- Applicant: Kai D. Feng , Wai-Kin Li , Ping-Chuan Wang , Zhijian Yang
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Steven Meyers
- Main IPC: H01K3/10
- IPC: H01K3/10 ; H01L23/522 ; H01L23/528 ; H04L9/32 ; H05K1/02

Abstract:
A method for fabricating an interconnect function array includes forming a first plurality of conductive lines on a substrate, forming an insulator layer over the first plurality of conductive lines and the substrate, removing portions of the insulator layer to define cavities in the insulator layer that expose portions of the substrate and the first plurality of conductive lines, wherein the removal of the portions of the insulator layer results in a substantially random arrangement of cavities exposing portions of the substrate and the first plurality of conductive lines, depositing a conductive material in the cavities, and forming a second plurality of conductive lines on portions of the conductive material in the cavities and the insulator layer.
Public/Granted literature
- US20130233608A1 Physical Unclonable Interconnect Function Array Public/Granted day:2013-09-12
Information query