Invention Grant
US09331066B2 Method and computer-readable medium for detecting parasitic transistors by utilizing equivalent circuit and threshold distance
有权
用于通过利用等效电路和阈值距离来检测寄生晶体管的方法和计算机可读介质
- Patent Title: Method and computer-readable medium for detecting parasitic transistors by utilizing equivalent circuit and threshold distance
- Patent Title (中): 用于通过利用等效电路和阈值距离来检测寄生晶体管的方法和计算机可读介质
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Application No.: US14163342Application Date: 2014-01-24
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Publication No.: US09331066B2Publication Date: 2016-05-03
- Inventor: Ming-Huei Tsai , Yao-Jen Hsieh , Kai-Ming Liu
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, P.C., Intellectual Property Attorneys
- Agent Anthony King
- Main IPC: G06F17/50
- IPC: G06F17/50 ; H01L27/02
Abstract:
A method of detecting a parasitic transistor detecting is provided. The method includes extracting several diodes from a selected area, selecting at least one diode pair from the diodes in accordance with signals connected to the diodes, and filtering the at least one diode pair in accordance with a threshold distance to determine whether at least one parasitic transistor is obtained.
Public/Granted literature
- US20150212134A1 DETECTING PARASITIC TRANSISTOR Public/Granted day:2015-07-30
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