Invention Grant
- Patent Title: Non-volatile memory with improved sensing window
- Patent Title (中): 具有改进的感应窗口的非易失性存储器
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Application No.: US14680524Application Date: 2015-04-07
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Publication No.: US09331085B2Publication Date: 2016-05-03
- Inventor: Hyun Min Choi , Shin Cheol Min , Ji Hoon Yoon
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Onello & Mello, LLP
- Priority: KR10-2014-0116373 20140902
- Main IPC: H01L27/01
- IPC: H01L27/01 ; H01L27/12 ; H01L31/0392 ; H01L27/112 ; H01L27/02

Abstract:
A semiconductor device may include: a substrate. First and second gate electrode patterns are disposed on first and second fin type active patterns. The first and second fin type active patterns include a first channel region disposed between a first impurity region and a second impurity region. The second gate electrode pattern crosses a first gate-separating region included in the second fin type active region. The first gate-separating region includes a trench and an embedded insulator filling at least a portion of the trench.
Public/Granted literature
- US20160064390A1 NON-VOLATILE MEMORY WITH IMPROVED SENSING WINDOW Public/Granted day:2016-03-03
Information query
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