Invention Grant
- Patent Title: Method and system for characterizing an array antenna using near-field measurements
- Patent Title (中): 使用近场测量来表征阵列天线的方法和系统
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Application No.: US14451466Application Date: 2014-08-05
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Publication No.: US09331751B2Publication Date: 2016-05-03
- Inventor: Thomas V. Sikina , Jack J. Schuss , Joseph E. Hilliard, Jr.
- Applicant: Raytheon Company
- Applicant Address: US MA Waltham
- Assignee: Raytheon Company
- Current Assignee: Raytheon Company
- Current Assignee Address: US MA Waltham
- Agency: Daly, Crowley, Mofford and Durkee, LLP
- Main IPC: H04B5/00
- IPC: H04B5/00 ; G01D18/00

Abstract:
Described embodiments calibrate an array antenna using near-field antenna measurements individually for each antenna element in an antenna under test (AUT). A signal is received at a first AUT antenna element from an antenna probe assembly by transmitting from the antenna probe assembly at each of multiple known probe locations in a near-field of the AUT. A signal is received at each probe location by transmitting from the first antenna element of the AUT to the antenna probe assembly. The received signals are combined into a combined signal for the first antenna element that de-correlates multi-path in the combination result. The combined signal is processed to generate a calibration coefficient for the first AUT antenna element. Remote boundary condition (RBC) testing is performed to reduce temporal instability. The multiple known probe locations lie on one of the following: a planar surface, a cylindrical surface, and a spherical surface.
Public/Granted literature
- US20160043778A1 Method and System for Characterizing an Array Antenna Using Near-Field Measurements Public/Granted day:2016-02-11
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