Invention Grant
- Patent Title: Workpiece positioning device positioning workpiece at two reference surfaces
- Patent Title (中): 工件定位装置将工件定位在两个参考面上
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Application No.: US14606235Application Date: 2015-01-27
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Publication No.: US09333610B2Publication Date: 2016-05-10
- Inventor: Naoki Akagawa
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: Fanuc Corporation
- Current Assignee: Fanuc Corporation
- Current Assignee Address: JP Yamanashi
- Agency: Fredrikson & Byron, P.A.
- Priority: JP2014-014734 20140129
- Main IPC: B23Q3/06
- IPC: B23Q3/06 ; B23Q3/18 ; B23Q16/00 ; B25B5/00 ; B25B5/04

Abstract:
A workpiece positioning device (1) includes a first positioning block (Bx) positioning one surface of a workpiece at a first reference surface in a first direction, two second positioning blocks (By1, By2) positioning a different surface of the workpiece at a second reference surface in a second direction, seat blocks (Bz1, Bz2, Bz3) positioning the workpiece in a third direction perpendicular to the first direction and the second direction, a push cylinder (30) pressing the workpiece in one direction toward an intersection line between the first and the second reference surface, a first unit (10) contacting with the one surface of the workpiece and correcting a posture of the workpiece before the first positioning block contacts with the workpiece, and a second unit (20) contacting with the different surface of the workpiece and correcting the posture of the workpiece before the second positioning blocks contact with the workpiece.
Public/Granted literature
- US20150209926A1 WORKPIECE POSITIONING DEVICE POSITIONING WORKPIECE AT TWO REFERENCE SURFACES Public/Granted day:2015-07-30
Information query
IPC分类: