Invention Grant
- Patent Title: Exhaust gas sampling device
- Patent Title (中): 废气取样装置
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Application No.: US13767443Application Date: 2013-02-14
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Publication No.: US09335235B2Publication Date: 2016-05-10
- Inventor: Montajir Rahman , Masahiro Nakane , Kenji Hara , Shigeru Nakatani
- Applicant: HORIBA, Ltd.
- Applicant Address: JP Kyoto
- Assignee: HORIBA, LTD.
- Current Assignee: HORIBA, LTD.
- Current Assignee Address: JP Kyoto
- Agency: Brooks Kushman P.C.
- Priority: JP2012-029921 20120214
- Main IPC: G01N1/22
- IPC: G01N1/22

Abstract:
An exhaust gas sampling device is intended to heat or cool a temperature of sampled exhaust gas flowing through a sampling line to a desired temperature in accordance with various exhaust gas conditions and usage conditions of the sampling line irrespective of a temperature of the exhaust gas flowing through an exhaust pipe, and includes the sampling line for sampling the exhaust gas to be introduced into an analyzing instrument; a plurality of heating parts provided along the sampling line from an upstream side to a downstream side for heating the exhaust gas flowing through the sampling line; and a temperature control part for individually setting set temperatures of the plurality of heating parts using the temperature of the exhaust gas in the exhaust pipe and a target temperature of the exhaust gas in an outlet side of the heating part located in the most downstream as parameters.
Public/Granted literature
- US20130209330A1 EXHAUST GAS SAMPLING DEVICE Public/Granted day:2013-08-15
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