Invention Grant
- Patent Title: Capacitor array and layout design method thereof
- Patent Title (中): 电容阵列及其布局设计方法
-
Application No.: US14396737Application Date: 2013-11-28
-
Publication No.: US09336347B2Publication Date: 2016-05-10
- Inventor: Yan Wang , Yu-Xin Wang , Gang-Yi Hu , Ting Li , Tao Liu , Guang-Bing Chen
- Applicant: China Electronic Technology Corporation, 24th Research Institute
- Applicant Address: CN Chongqing
- Assignee: CHINA ELECTRONIC TECHNOLOGY CORPORATION, 24TH RESEARCH INSTITUTE
- Current Assignee: CHINA ELECTRONIC TECHNOLOGY CORPORATION, 24TH RESEARCH INSTITUTE
- Current Assignee Address: CN Chongqing
- Agent Cheng-Ju Chiang
- Priority: CN201310502617 20131023
- International Application: PCT/CN2013/087992 WO 20131128
- International Announcement: WO2015/058437 WO 20150430
- Main IPC: H01G4/38
- IPC: H01G4/38 ; G06F17/50 ; H01G15/00 ; H03M1/16 ; H03M1/44

Abstract:
A layout design method is provided for generating capacitor arrays being described in four steps: first, the wiring mode of unit capacitors is defined allowing the wire being connected to the upper plate to parallel that to the lower one, second, a capacitor array layout is designed with capacitors being distributed in Mh lines, Mh is the maximum of capacitors' lines, the line numbers of Class 1 to Class K capacitors are defined in the unilateral capacitor array, third, the wiring mode is set for capacitor array making sure the lengths of the wires to the upper and lower plates of unit capacitors are equal, at last, parasitic parameters are characterized in ways that verify the layout. A capacitor array is provided as well. By eliminating capacitance mismatching caused by parasitic capacitance, the method works to generate a well-matched capacitor array in an easy and efficient way.
Public/Granted literature
- US20150370952A1 CAPACITOR ARRAY AND LAYOUT DESIGN METHOD THEREOF Public/Granted day:2015-12-24
Information query