Invention Grant
- Patent Title: System and method for outlier detection via estimating clusters
- Patent Title (中): 通过估计簇进行异常值检测的系统和方法
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Application No.: US13615202Application Date: 2012-09-13
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Publication No.: US09336484B1Publication Date: 2016-05-10
- Inventor: David J. Iverson
- Applicant: David J. Iverson
- Applicant Address: US DC Washington
- Assignee: The United States of America as Represented by the Administrator of the National Aeronautics and Space Administration (NASA)
- Current Assignee: The United States of America as Represented by the Administrator of the National Aeronautics and Space Administration (NASA)
- Current Assignee Address: US DC Washington
- Agent Christopher J. Menke; Robert M. Padilla; John F. Schipper
- Main IPC: G06F15/18
- IPC: G06F15/18 ; G06N5/00 ; G06N5/02 ; G06F17/30 ; G06F17/18 ; G06N3/08 ; G06F11/30

Abstract:
An efficient method and system for real-time or offline analysis of multivariate sensor data for use in anomaly detection, fault detection, and system health monitoring is provided. Models automatically derived from training data, typically nominal system data acquired from sensors in normally operating conditions or from detailed simulations, are used to identify unusual, out of family data samples (outliers) that indicate possible system failure or degradation. Outliers are determined through analyzing a degree of deviation of current system behavior from the models formed from the nominal system data. The deviation of current system behavior is presented as an easy to interpret numerical score along with a measure of the relative contribution of each system parameter to any off-nominal deviation. The techniques described herein may also be used to “clean” the training data.
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