Invention Grant
- Patent Title: Nonvoltile resistance memory and its operation thereof
- Patent Title (中): 不挥发性电阻记忆及其操作
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Application No.: US14809280Application Date: 2015-07-27
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Publication No.: US09336869B2Publication Date: 2016-05-10
- Inventor: Steve S. Chung , E-Ray Hsieh
- Applicant: NATIONAL CHIAO TUNG UNIVERSITY
- Applicant Address: TW Hsinchu
- Assignee: NATIONAL CHIAO TUNG UNIVERSITY
- Current Assignee: NATIONAL CHIAO TUNG UNIVERSITY
- Current Assignee Address: TW Hsinchu
- Agency: CKC & Partners Co., Ltd.
- Main IPC: G11C13/00
- IPC: G11C13/00 ; H01L45/00 ; H01L27/24 ; H01L29/51

Abstract:
A memory cell and the associated array circuits are disclosed. The memory array circuit includes a plurality of memory units, in which each of the memory units includes a storage device and a field-effect transistor. The storage device includes a top electrode, a bottom electrode and an oxide-based dielectric layer. The top electrode is formed by metal or metallic oxide dielectrics and connected to a word line. The bottom electrode is formed by metal, and the oxide-based dielectric layer is placed between the top electrode and the bottom electrode. The field-effect transistor includes a gate terminal connected to the bottom electrode, a source terminal connected to a ground line, and a drain terminal connected to a bit line. The resistance of the storage device is configured to be adjusted according to a first voltage applied to the word line and a second voltage applied to the bit line.
Public/Granted literature
- US20160027507A1 NONVOLTILE RESISTANCE MEMORY AND ITS OPERATION THEREOF Public/Granted day:2016-01-28
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