A repair circuit includes a fuse set latch array including a plurality of fuse set latches, and configured to store fuse informations in target fuse latches selected among the plurality of fuse set latches in response to fuse latch select signals; a fuse information control unit configured to generate the fuse latch select signals by using boot-up source signals generated by differently combining boot-up mode region select informations according to a region determination signal; and a repair processing unit configured to compare an address inputted from an exterior and the fuse informations, and access a normal memory cell corresponding to the external address or a redundant memory cell.