Invention Grant
- Patent Title: Anisotropic dielectric material gate spacer for a field effect transistor
-
Application No.: US14524079Application Date: 2014-10-27
-
Publication No.: US09337041B2Publication Date: 2016-05-10
- Inventor: Emre Alptekin , Hari V. Mallela , Reinaldo Vega
- Applicant: GLOBAL FOUNDRIES INC.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Main IPC: H01L21/28
- IPC: H01L21/28 ; H01L29/772 ; H01L29/66 ; H01L29/49 ; H01L29/51 ; H01L21/8234 ; H01L21/84 ; H01L27/088 ; H01L27/12

Abstract:
Capacitive coupling between a gate electrode and underlying portions of the source and drain regions can be enhanced while suppressing capacitive coupling between the gate electrode and laterally spaced elements such as contact via structures for the source and drain regions. A transistor including a gate electrode and source and drain regions is formed employing a disposable gate spacer. The disposable gate spacer is removed to form a spacer cavity, which is filled with an anisotropic dielectric material to form an anisotropic gate spacer. The anisotropic dielectric material is aligned with an electrical field such that lengthwise directions of the molecules of the anisotropic dielectric material are aligned vertically within the spacer cavity. The anisotropic gate spacer provides a higher dielectric constant along the vertical direction and a lower dielectric constant along the horizontal direction.
Public/Granted literature
- US20150111350A1 ANISOTROPIC DIELECTRIC MATERIAL GATE SPACER FOR A FIELD EFFECT TRANSISTOR Public/Granted day:2015-04-23
Information query
IPC分类: