Invention Grant
- Patent Title: Chemical mechanical polishing fixture having lateral perforation structures
- Patent Title (中): 化学机械抛光夹具具有侧向穿孔结构
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Application No.: US14197348Application Date: 2014-03-05
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Publication No.: US09337075B2Publication Date: 2016-05-10
- Inventor: Hui-Chen Yen
- Applicant: KAI FUNG TECHNOLOGY CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: KAI FUNG TECHNOLOGY CO., LTD.
- Current Assignee: KAI FUNG TECHNOLOGY CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Rabin & Berdo, P.C.
- Priority: TW102209298U 20130517
- Main IPC: B24B37/32
- IPC: B24B37/32 ; H01L21/687

Abstract:
A chemical mechanical polishing fixture having lateral perforation structures includes: a holder and a retaining ring. The holder includes: an annular substrate, a plurality of third holes and a plurality of lateral perforation structures. The annular substrate has a first joint surface, an outer periphery and an inner periphery. The third holes are annularly arranged on the first joint surface, and each third hole includes a first inner thread structure for individually providing a screw to be locked to a semiconductor machine. The lateral perforation structures penetrate from the outer periphery to the inner periphery of the annular substrate, where the lateral perforations are selected from: a converse U-shaped cube structure, an converse U-shaped cube structure, a cuboid structure, a cylinder structure, an elliptic cylinder structure, a flat cuboid structure or a hybrid structure of at least one cuboid structure and the above.
Public/Granted literature
- US20140342643A1 CHEMICAL MECHANICAL POLISHING FIXTURE HAVING LATERAL PERFORATION STRUCTURES Public/Granted day:2014-11-20
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