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US09337078B2 Heat dissipation through device isolation 有权
通过器件隔离散热

Heat dissipation through device isolation
Abstract:
According to a structure herein, a silicon substrate has an active device in the silicon substrate. A dielectric film is on the active device. An isolation trench is in the dielectric film surrounding the active device. The trench extends through the dielectric film and at least partially into the silicon substrate. A core is in the isolation trench. The core comprises material having thermal conductivity greater than silicon dioxide and electrical conductivity approximately equal to silicon dioxide.
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