Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same
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Application No.: US14825801Application Date: 2015-08-13
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Publication No.: US09337353B2Publication Date: 2016-05-10
- Inventor: Kyung-Sik Mun
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2013-0129315 20131029
- Main IPC: H01L21/28
- IPC: H01L21/28 ; H01L29/792 ; H01L29/66 ; H01L21/76 ; H01L27/115 ; H01L21/02 ; H01L21/311 ; H01L21/3213

Abstract:
A semiconductor device and a method of manufacturing the same. The semiconductor device includes a channel, a gate, and a memory layer is interposed between the channel and the gate. The memory layer includes a tunnel insulating layer adjacent to the channel, a charge blocking layer adjacent to the gate, and a charge storing layer interposed between the tunnel insulating layer and the charge blocking layer. The tunnel insulating layer includes a first insulating layer adjacent to the channel and an air layer interposed between the first insulating layer and the charge storing layer.
Public/Granted literature
- US20150348992A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Public/Granted day:2015-12-03
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