Invention Grant
- Patent Title: Projection system, projector, and calibration method thereof
- Patent Title (中): 投影系统,投影仪及其校准方法
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Application No.: US13912796Application Date: 2013-06-07
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Publication No.: US09338418B2Publication Date: 2016-05-10
- Inventor: Chung-Yi Yang
- Applicant: DELTA ELECTRONICS, INC.
- Applicant Address: TW
- Assignee: DELTA ELECTRONICS, INC.
- Current Assignee: DELTA ELECTRONICS, INC.
- Current Assignee Address: TW
- Agency: Hauptman Ham, LLP
- Priority: TW102110147 20130322
- Main IPC: G09G5/10
- IPC: G09G5/10 ; H04N9/31

Abstract:
A projection system includes a projector, an uncalibrated DDL output unit, a light detection device, a characteristic curve computation unit, a calibration unit and a calibrated DDL output unit. The uncalibrated DDL output unit is used for driving the projector to project a frame to an area of a projected object. The light detection device is used for detecting brightness values of the area. The characteristic curve computation unit is used for obtaining a characteristic curve based on the uncalibrated DDLs and the detected brightness values. The calibration unit is used for executing a calibration process according to the characteristic curve and GSDF, so as to map each of the uncalibrated DDLs to a calibrated DDL. The calibrated DDL output unit is used for driving the projector to project another frame to the area of the projected object.
Public/Granted literature
- US20140285532A1 PROJECTION SYSYEM, PROJECTOR, AND CALIBRATION METHOD THEREOF Public/Granted day:2014-09-25
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