Invention Grant
- Patent Title: Goods inspection apparatus using distributed X-ray source
- Patent Title (中): 商品检验仪器采用分布式X射线源
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Application No.: US14134845Application Date: 2013-12-19
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Publication No.: US09341736B2Publication Date: 2016-05-17
- Inventor: Huaping Tang , Yuanjing Li , Ziran Zhao , Yaohong Liu , Zhanfeng Qin , Jinyu Zhang , Hu Tang
- Applicant: NUCTECH COMPANY LIMITED , TSINGHUA UNIVERSITY
- Applicant Address: CN Beijing CN Beijing
- Assignee: TSINGHUA UNIVERSITY,NUCTECH COMPANY LIMITED
- Current Assignee: TSINGHUA UNIVERSITY,NUCTECH COMPANY LIMITED
- Current Assignee Address: CN Beijing CN Beijing
- Agency: Casimir Jones, SC
- Priority: CN201210588867 20121231
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01V5/00
Abstract:
This invention relates to an X-ray goods inspection apparatus, and in particular to a goods inspection apparatus using distributed X-ray source.
Public/Granted literature
- US20140185754A1 GOODS INSPECTION APPARATUS USING DISTRIBUTED X-RAY SOURCE Public/Granted day:2014-07-03
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