Invention Grant
- Patent Title: Deflection mirror and projection exposure apparatus for microlithography comprising such a deflection mirror
- Patent Title (中): 偏转镜和用于微光刻的投影曝光装置,包括这种偏转镜
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Application No.: US14032724Application Date: 2013-09-20
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Publication No.: US09341958B2Publication Date: 2016-05-17
- Inventor: Hartmut Enkisch , Stephan Muellender , Martin Endres
- Applicant: CARL ZEISS SMT GmbH
- Applicant Address: DE Oberkochen
- Assignee: Carl Zeiss SMT GmbH
- Current Assignee: Carl Zeiss SMT GmbH
- Current Assignee Address: DE Oberkochen
- Agency: Edell, Shapiro & Finnan, LLC
- Priority: DE102011075579 20110510
- Main IPC: G03B27/54
- IPC: G03B27/54 ; G03F7/20 ; G02B17/06 ; G21K1/06 ; B82Y10/00

Abstract:
A deflection mirror (1, 501, etc.) for a microlithography projection exposure apparatus for illuminating an object field in an object plane of the projection exposure apparatus (1067) using the deflection mirror with grazing incidence. This deflection mirror has a substrate (3, 503, etc.) and at least one layer system (5, 505, etc.), and during operation light impinges on said mirror at a multiplicity of angles of incidence, wherein the layer system is designed such that, for light having a wavelength of less than 30 nm, for an angle of incidence of between 55° and 70°, the variation of the reflectivity is less than 20%, in particular less than 12%.
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