Invention Grant
- Patent Title: Optical endpoint detection system
- Patent Title (中): 光端点检测系统
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Application No.: US13440564Application Date: 2012-04-05
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Publication No.: US09347132B2Publication Date: 2016-05-24
- Inventor: Balasubramanian Ramachandran , Masato Ishii , Aaron Muir Hunter
- Applicant: Balasubramanian Ramachandran , Masato Ishii , Aaron Muir Hunter
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Moser Taboada
- Agent Alan Taboada
- Main IPC: B08B3/00
- IPC: B08B3/00 ; C23C16/44 ; H01L21/67 ; C23C16/52

Abstract:
Methods and apparatus for determining an endpoint of a process chamber cleaning process are provided. In some embodiments, a processing system having an endpoint detection system may include a process chamber having internal surfaces requiring periodic cleaning due to processes performed in the process chamber; and an endpoint detection system that includes a light detector positioned to detect light reflected off of a first internal surface of the process chamber; and a controller coupled to the light detector and configured to determine an endpoint of a cleaning process based upon the detected reflected light.
Public/Granted literature
- US20120273005A1 OPTICAL ENDPOINT DETECTION SYSTEM Public/Granted day:2012-11-01
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