Invention Grant
- Patent Title: Absolute measurement method and apparatus thereof for non-linear error
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Application No.: US14166796Application Date: 2014-01-28
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Publication No.: US09347823B2Publication Date: 2016-05-24
- Inventor: Ruoduan Sun
- Applicant: National Institute of Metrology, P.R.China
- Applicant Address: CN Beijing
- Assignee: NATIONAL INSTITUTE OF METROLOGY
- Current Assignee: NATIONAL INSTITUTE OF METROLOGY
- Current Assignee Address: CN Beijing
- Agent Gokalp Bayramoglu
- Priority: CN201310279839 20130704
- Main IPC: G01J1/10
- IPC: G01J1/10 ; G01J1/02 ; G01J3/02 ; G01J1/04

Abstract:
The present invention discloses a method for measuring absolute value of non-linear error and an apparatus thereof. The method comprises: placing N reflecting plates jointed together at the sample port of the optical measuring instrument at the same time, wherein each of reflecting plate has a same covering area at the sample port; placing an aperture along light paths of the optical measuring instrument; adjusting the number of reflecting plates as used according to a position in the measuring range of the optical measuring instrument where the non-linear error is required to be measured; following every adjustment, acquiring the output results when the adjusted reflecting plates are placed at the sample port; performing a computation processing for non-linear error to the output results; and acquiring the non-linear error of the output results of the optical measuring instrument.
Public/Granted literature
- US20150009501A1 Absolute measurement method and apparatus thereof for non-linear error Public/Granted day:2015-01-08
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