Invention Grant
US09349471B2 Nonvolatile memory device, storage device having the same, and operation and read methods thereof
有权
非易失性存储装置,具有该存储装置的存储装置及其操作和读取方法
- Patent Title: Nonvolatile memory device, storage device having the same, and operation and read methods thereof
- Patent Title (中): 非易失性存储装置,具有该存储装置的存储装置及其操作和读取方法
-
Application No.: US14670879Application Date: 2015-03-27
-
Publication No.: US09349471B2Publication Date: 2016-05-24
- Inventor: Sung-Won Yun
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2014-0052578 20140430
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/26 ; G11C16/04 ; G11C16/24

Abstract:
A method is for operating a nonvolatile memory device, the nonvolatile memory device including at least one string connected to a bit line, the at least one string including a plurality of memory cells connected in series, each of the plurality of memory cells being connected to a respective word line among a plurality of word lines and stacked in a direction perpendicular to a substrate. The method includes applying a word line voltage needed for an operation to a first word line among the word lines, applying a recovery voltage higher than a ground voltage to the first word line after the operation, and then floating the first word line.
Public/Granted literature
- US20150318045A1 NONVOLATILE MEMORY DEVICE, STORAGE DEVICE HAVING THE SAME, AND OPERATION AND READ METHODS THEREOF Public/Granted day:2015-11-05
Information query