Invention Grant
US09349772B2 Methods for fabricatingintegrated circuits with spin torque transfer magnetic randomaccess memory (STT-MRAM) including a passivation layer formed along lateral sidewalls of a magnetic tunnel junction of the STT-MRAM
有权
用自旋转矩传递磁性随机存取存储器(STT-MRAM)制造集成电路的方法包括沿着STT-MRAM的磁性隧道结的侧壁形成的钝化层
- Patent Title: Methods for fabricatingintegrated circuits with spin torque transfer magnetic randomaccess memory (STT-MRAM) including a passivation layer formed along lateral sidewalls of a magnetic tunnel junction of the STT-MRAM
- Patent Title (中): 用自旋转矩传递磁性随机存取存储器(STT-MRAM)制造集成电路的方法包括沿着STT-MRAM的磁性隧道结的侧壁形成的钝化层
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Application No.: US14261543Application Date: 2014-04-25
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Publication No.: US09349772B2Publication Date: 2016-05-24
- Inventor: Wanbing Yi , Yang Hong , Yi Jiang , Francis Poh , Tze Ho Simon Chan , Juan Boon Tan
- Applicant: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Current Assignee: GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Current Assignee Address: SG Singapore
- Agency: Ingrassia Fisher & Lorenz, P.C.
- Main IPC: H01L27/10
- IPC: H01L27/10 ; H01L27/22 ; H01L43/02 ; H01L43/08 ; H01L43/10 ; H01L43/12 ; G11C11/16

Abstract:
A method of fabricating an integrated circuit includes depositing a bottom electrode layer, an MTJ layer, and a top electrode layer over a passivation layer and within a trench of the passivation layer and removing portions of the MTJ layer and the top electrode layer to form an MTJ/top electrode stack over the bottom electrode layer and at least partially within portions of the trench having being reopened by said removing. The method further includes forming a further passivation layer over the MTJ/top electrode stack, forming a further ILD layer of the further passivation layer, and reforming a top electrode layer over the ILD layer and over the MTJ/top electrode stack. Still further, the method includes removing portions of the bottom electrode layer, the further passivation layer, the further ILD layer, and the re-formed top electrode layer to form a bottom electrode/MTJ/top electrode stack.
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