Invention Grant
- Patent Title: FinFETs and methods for forming the same
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Application No.: US14625848Application Date: 2015-02-19
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Publication No.: US09349841B2Publication Date: 2016-05-24
- Inventor: Yu-Lien Huang , Chun-Hsiang Fan , Tsu-Hsiu Perng , Chi-Kang Liu , Yung-Ta Li , Ming-Huan Tsai , Clement Hsingjen Wann , Chi-Wen Liu
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater Matsil, LLP
- Main IPC: H01L29/34
- IPC: H01L29/34 ; H01L29/66 ; H01L29/78 ; H01L21/306 ; H01L21/324 ; H01L29/06

Abstract:
A finFET and methods for forming a finFET are disclosed. A structure comprises a substrate, a fin, a gate dielectric, and a gate electrode. The substrate comprises the fin. The fin has a major surface portion of a sidewall, and the major surface portion comprises at least one lattice shift. The at least one lattice shift comprises an inward or outward shift relative to a center of the fin. The gate dielectric is on the major surface portion of the sidewall. The gate electrode is on the gate dielectric.
Public/Granted literature
- US20150171187A1 FinFETs and Methods for Forming the Same Public/Granted day:2015-06-18
Information query
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