Invention Grant
- Patent Title: Sample analyzing method and sample analyzer
- Patent Title (中): 样品分析方法和样品分析仪
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Application No.: US14470521Application Date: 2014-08-27
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Publication No.: US09354161B2Publication Date: 2016-05-31
- Inventor: Mitsumasa Sakamoto , Masatsugu Ozasa
- Applicant: Sysmex Corporation
- Applicant Address: JP Kobe-shi, Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-shi, Hyogo
- Agency: Brinks Gilson & Lione
- Priority: JP2013-178939 20130830
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/21 ; G01N33/50 ; G01N15/14 ; G01N15/00 ; G01N21/05

Abstract:
Disclosed is a sample analyzing method comprising: flowing a measurement specimen prepared by mixing a sample and reagent through a flow cell; irradiating particles in the measurement specimen flowing through the flow cell with linearly polarized light and thereby producing scattered light; detecting a change of polarization condition of the scattered light produced by the particles; and discriminating erythrocytes from crystals in the measurement specimen based on the change of polarization condition.
Public/Granted literature
- US20150064742A1 SAMPLE ANALYZING METHOD AND SAMPLE ANALYZER Public/Granted day:2015-03-05
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