Invention Grant
- Patent Title: Model estimation device and model estimation method
- Patent Title (中): 模型估计装置和模型估计方法
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Application No.: US14066281Application Date: 2013-10-29
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Publication No.: US09355196B2Publication Date: 2016-05-31
- Inventor: Yusuke Muraoka , Ryohei Fujimaki
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Wilmer Cutler Pickering Hale and Dorr LLP
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A model estimation device includes: a data input unit 101; a state number setting unit; an initialization unit; a latent variable variational probability computation unit which computes a variational probability of a latent variable so as to maximize a lower bound of a model posterior probability limited in degree of freedom; a component optimization unit which estimates an optimal type of each component and a parameter thereof so as to maximize the lower bound of the model posterior probability limited in degree of freedom and separated for each component of a latent variable model; a free parameter selection variable computation unit which computes the free parameter selection variable; an optimality determination unit which determines whether or not to continue the maximization of the lower bound of the model posterior probability; and a result output unit.
Public/Granted literature
- US20150120254A1 MODEL ESTIMATION DEVICE AND MODEL ESTIMATION METHOD Public/Granted day:2015-04-30
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