Invention Grant
- Patent Title: Testing method of a magnetic head, and testing apparatus thereof
- Patent Title (中): 磁头测试方法及其测试装置
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Application No.: US13923736Application Date: 2013-06-21
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Publication No.: US09355660B2Publication Date: 2016-05-31
- Inventor: Hokei Lam , Mankit Lee , Cheukman Lui , Wahchun Chan , Juren Ding , Rongkwang Ni , Cheukwing Leung , Wanyin Kwan
- Applicant: SAE Magnetics (H.K.) Ltd.
- Applicant Address: CN Hong Kong
- Assignee: SAE MAGNETICS (H.K.) LTD.
- Current Assignee: SAE MAGNETICS (H.K.) LTD.
- Current Assignee Address: CN Hong Kong
- Agency: Nixon & Vanderhye, P.C.
- Priority: CN201310169758 20130509
- Main IPC: G01R33/12
- IPC: G01R33/12 ; G11B5/455

Abstract:
A testing method of a magnetic head includes: applying a first magnetic field with a constant intensity in a first direction that is the same with that of the longitudinal bias field to the magnetic head, simultaneously applying a second magnetic field with variant intensities in a second direction traversing the air bearing surface, and measuring a first noise; applying a third magnetic field with a constant intensity in a third direction that is opposite to the first direction to the magnetic head, simultaneously applying the second magnetic field with variant intensities in the second direction, and measuring a second noise; and analyzing noise change between the first noise and the second noise. The invention can screen out defective magnetic heads that possess poor noise characteristic and unstable performance.
Public/Granted literature
- US20140334279A1 TESTING METHOD OF A MAGNETIC HEAD, AND TESTING APPARATUS THEREOF Public/Granted day:2014-11-13
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