Invention Grant
- Patent Title: Transducer write field curvature characterization and compensation
- Patent Title (中): 传感器写场曲率表征和补偿
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Application No.: US14076155Application Date: 2013-11-08
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Publication No.: US09355679B1Publication Date: 2016-05-31
- Inventor: Huaan Zhang , Barmeshwar Vikramaditya
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Agency: Cesari & Reed, LLP
- Agent Kirk A. Cesari
- Main IPC: G11B5/09
- IPC: G11B5/09 ; G11B20/10 ; G11B27/36 ; G11B19/04 ; G11B5/596

Abstract:
The disclosure is related to apparatuses and methods for characterizing and compensating for curvature in a write field generated by a data storage device transducer. In some embodiments, the curvature of a write field generated by a data storage device transducer may be characterized. Some embodiments can include a circuit to apply a phase compensation value based on a deterministic phase offset value, which may correspond with the write field curvature characterization.
Information query
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