Invention Grant
US09355733B2 Memory sensing system comprising nonvolatile memory device and related method of operation
有权
包括非易失性存储器件和相关操作方法的存储器感测系统
- Patent Title: Memory sensing system comprising nonvolatile memory device and related method of operation
- Patent Title (中): 包括非易失性存储器件和相关操作方法的存储器感测系统
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Application No.: US14062088Application Date: 2013-10-24
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Publication No.: US09355733B2Publication Date: 2016-05-31
- Inventor: Jong-Young Kim , Ki Tae Park , Bo Geun Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2010-0044124 20100511
- Main IPC: G11C16/26
- IPC: G11C16/26 ; G11C11/56

Abstract:
A memory system performs a first sensing operation to sense whether multi-level cells assume an on-cell state or an off-cell state in response to a first read voltage applied to a selected word line. It then supplies a pre-charge voltage to bit lines corresponding to multi-level cells that have been sensed as assuming the off-cell state in response to the first read voltage, and it performs a second sensing operation with the supplied pre-charge voltage to sense whether each of the multi-level cells that have been sensed as assuming the off-cell state assumes an on-cell state or an off-cell state in response to a second read voltage applied to the selected word line.
Public/Granted literature
- US20140043904A1 MEMORY SYSTEM COMPRISING NONVOLATILE MEMORY DEVICE AND RELATED METHOD OF OPERATION Public/Granted day:2014-02-13
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