Invention Grant
- Patent Title: Integrated circuit with sensor area and resin dam
- Patent Title (中): 集成电路与传感器区域和树脂坝
-
Application No.: US14597293Application Date: 2015-01-15
-
Publication No.: US09355870B1Publication Date: 2016-05-31
- Inventor: John B. Pavelka
- Applicant: Silicon Laboratories Inc.
- Applicant Address: US TX Austin
- Assignee: Silicon Laboratories Inc.
- Current Assignee: Silicon Laboratories Inc.
- Current Assignee Address: US TX Austin
- Agency: Egan, Peterman, Enders & Huston LLP
- Main IPC: H01L21/56
- IPC: H01L21/56 ; H01L23/31 ; G01N27/12 ; G01N25/00 ; G01N33/00 ; G01F1/00

Abstract:
A technique for forming an integrated circuit die that contains an integrated sensor is provided. The integrated circuit die may be configured such that the sensor is exposed to ambient environmental conditions such that the sensor may detect ambient conditions. The integrated circuit die may be generally protected from environmental exposure by a mold resin. The mold resin may be formed in areas outside of a sensor region. Resin bleed from the mold resin into the sensor region may be prevented by the use of a resin dam that extends from the surface of the integrated circuit die. The resin dam may surround the sensor region.
Information query
IPC分类: