Invention Grant
- Patent Title: IO driver impedance calibration
- Patent Title (中): IO驱动器阻抗校准
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Application No.: US14400743Application Date: 2012-05-30
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Publication No.: US09356600B2Publication Date: 2016-05-31
- Inventor: Michael Priel , Dan Kuzmin , Sergey Sofer
- Applicant: Michael Priel , Dan Kuzmin , Sergey Sofer
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- International Application: PCT/IB2012/052696 WO 20120530
- International Announcement: WO2013/179088 WO 20131205
- Main IPC: H03K17/16
- IPC: H03K17/16 ; H03K19/003 ; H03K19/0185 ; H03K19/00 ; G11C7/04 ; G11C7/10 ; G11C11/4096 ; G11C29/02

Abstract:
An IO driver for an integrated circuit and a method for calibrating such an IO driver are provided. The IO driver comprises a plurality of IO driver cells, a plurality of IO partial driver cells and an external resistor. The IO driver cells control IO operations for a corresponding plurality of data channels of the integrated circuit. The IO partial driver cells are coupled to respective cells of the plurality of IO driver cells. The external resistor provides a reference impedance. The reference partial driver cell is coupled to the external resistor and is arranged to determine the reference impedance and to provide information depending on the reference impedance to the IO partial driver cells. The IO partial driver cells are arranged to calibrate the respective IO driver cells based on the provided information.
Public/Granted literature
- US20150145556A1 IO DRIVER IMPEDANCE CALIBRATION Public/Granted day:2015-05-28
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