Invention Grant
- Patent Title: Temperature measurement system
- Patent Title (中): 温度测量系统
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Application No.: US13423814Application Date: 2012-03-19
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Publication No.: US09357930B2Publication Date: 2016-06-07
- Inventor: David E. Quinn , John A. Lane
- Applicant: David E. Quinn , John A. Lane
- Applicant Address: US NY Skaneateles Falls
- Assignee: WELCH ALLYN, INC.
- Current Assignee: WELCH ALLYN, INC.
- Current Assignee Address: US NY Skaneateles Falls
- Main IPC: A61B5/01
- IPC: A61B5/01 ; A61B5/00 ; G01J5/02

Abstract:
A temperature measurement system includes a temperature probe having a head and an infrared temperature sensor disposed in the head. The system also includes a replaceable probe cover removably attachable to the head. The probe cover includes a body, a substantially cylindrical waveguide extending from the body, and a distal tip. The waveguide is configured to direct radiation entering the distal tip to the temperature sensor when the probe cover is attached to the head.
Public/Granted literature
- US20130245488A1 TEMPERATURE MEASUREMENT SYSTEM Public/Granted day:2013-09-19
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