中科微点-全球专利检索

  1. Login
  2. Sign Up
Invention Grant
US09360296B2 System for calculation of material properties using reflection terahertz radiation and an external reference structure 有权
使用反射太赫兹辐射和外部参考结构计算材料性质的系统

  • Patent Title: System for calculation of material properties using reflection terahertz radiation and an external reference structure
  • Patent Title (中): 使用反射太赫兹辐射和外部参考结构计算材料性质的系统
  • Application No.: US14436073
    Application Date: 2013-10-18
  • Publication No.: US09360296B2
    Publication Date: 2016-06-07
  • Inventor: Jeffrey S. White , David Zimdars
  • Applicant: Picometrix, LLC
  • Applicant Address: US MI Ann Arbor
  • Assignee: PICOMETRIX, LLC
  • Current Assignee: PICOMETRIX, LLC
  • Current Assignee Address: US MI Ann Arbor
  • Agency: Brinks Gilson & Lione
  • International Application: PCT/US2013/065671 WO 20131018
  • International Announcement: WO2014/063044 WO 20140424
  • Main IPC: G01B9/02
  • IPC: G01B9/02 ;  G01N21/35 ;  H04J14/02
System for calculation of material properties using reflection terahertz radiation and an external reference structure
Abstract:
A system for interpreting terahertz radiation includes a terahertz transmitter configured to output a pulse of terahertz radiation and a terahertz receiver configured to receive at least a portion of the pulse of radiation from the terahertz transmitter. The terahertz receiver is configured to output a signal based on the radiation received by the terahertz receiver.
Abstract(Chinese):

用于解释太赫兹辐射的系统包括被配置为输出太赫兹辐射脉冲的太赫兹发射器和被配置为接收来自太赫兹发射器的辐射脉冲的至少一部分的太赫兹接收器。 太赫兹接收器被配置为基于由太赫兹接收器接收的辐射输出信号。

Public/Granted literature
Information query
Espacenet
Patent Agency Ranking
0/0