Invention Grant
- Patent Title: Inspection device and inspection method
- Patent Title (中): 检验装置及检验方法
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Application No.: US14079568Application Date: 2013-11-13
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Publication No.: US09360436B2Publication Date: 2016-06-07
- Inventor: Yi-Chen Hsieh , Chih-Jung Chiang , Fu-Cheng Yang
- Applicant: Industrial Technology Research Institute
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Priority: TW101147993A 20121218
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01N21/21 ; G02B5/30 ; G01N21/95

Abstract:
The disclosure provides an inspection device including a light source module, an image receiving module and a processing unit. The light source module emits a first incident light and a second incident light to a device under test (DUT). The image receiving module receives a first image corresponding to the DUT irradiated by the first incident light, and receives a second image corresponding to the DUT irradiated by the second incident light. The processing unit calculates the contrast ratio of the first image and the second image to obtain a high-contrast image for inspection.
Public/Granted literature
- US20140168417A1 INSPECTION DEVICE AND INSPECTION METHOD Public/Granted day:2014-06-19
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