Invention Grant
- Patent Title: Method of capacitive measurement by non-regular electrodes, and apparatus implementing such a method
- Patent Title (中): 非常规电极的电容测量方法以及实施这种方法的装置
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Application No.: US14347070Application Date: 2013-03-08
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Publication No.: US09360512B2Publication Date: 2016-06-07
- Inventor: Bruno Luong
- Applicant: QUICKSTEP TECHNOLOGIES LLC
- Applicant Address: US DE Wilmington
- Assignee: QUICKSTEP TECHNOLOGIES LLC
- Current Assignee: QUICKSTEP TECHNOLOGIES LLC
- Current Assignee Address: US DE Wilmington
- Agency: Morrison & Foerster LLP
- Priority: FR1252271 20120313
- International Application: PCT/EP2013/054729 WO 20130308
- International Announcement: WO2013/135575 WO 20130919
- Main IPC: G01R25/00
- IPC: G01R25/00 ; G01R27/26 ; G06F3/041 ; G06F3/044 ; G01R35/00

Abstract:
A method for providing corrected measurements of absolute capacitance of an object in the proximity of at least two independent electrodes of a non-optimized shape integrated in a human-machine interface device for detecting the object. The method includes measuring, for each electrode, an actual value of absolute capacitance between the electrode and the object, and calculating a prediction by applying a multi-variable nonlinear prediction model to the actual values of absolute capacitance so as to obtain an image of probability densities. Then, using the probability densities as corrected absolute capacitance values for detecting the object.
Public/Granted literature
- US20140379287A1 METHOD OF CAPACITIVE MEASUREMENT BY NON-REGULAR ELECTRODES, AND APPARATUS IMPLEMENTING SUCH A METHOD Public/Granted day:2014-12-25
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