Invention Grant
US09360568B2 Method for processing data derived from an ionizing radiation detector 有权
用于处理从电离辐射检测器得到的数据的方法

Method for processing data derived from an ionizing radiation detector
Abstract:
Measurements of electric charges obtained by the impact of ionizing radiation on a semiconductor detector are grouped in a histogram. Calibrations and data otherwise obtained are used to obtain acceptance probabilities of measurements, which are used to construct a histogram of events by weighting the measurements so as to exclude the influence of some factors (such as diffused radiation) or on the contrary to enhance this influence.
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