Invention Grant
- Patent Title: Devices and method for testing power-on reset voltage
- Patent Title (中): 测试上电复位电压的器件和方法
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Application No.: US14193649Application Date: 2014-02-28
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Publication No.: US09362904B2Publication Date: 2016-06-07
- Inventor: Chris C. Dao , Stefano Pietri , Juxiang Ren
- Applicant: Chris C. Dao , Stefano Pietri , Juxiang Ren
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G01R31/3187
- IPC: G01R31/3187 ; H03K17/22 ; G01R19/165 ; G06F1/24

Abstract:
A system having a power on reset circuit including a voltage divide), a multiplexer coupled to two outputs of the voltage divider, a first comparator coupled to the multiplexer and a reference, a logic gate coupled to the first comparator, a second comparator coupled to one of the two outputs of the voltage divider, and an emulation gate coupled to the second comparator.
Public/Granted literature
- US20150247893A1 DEVICES AND METHOD FOR TESTING POWER-ON RESET VOLTAGE Public/Granted day:2015-09-03
Information query
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