Invention Grant
- Patent Title: Determining faulty nodes within a wireless sensor network
- Patent Title (中): 确定无线传感器网络中的故障节点
-
Application No.: US14164906Application Date: 2014-01-27
-
Publication No.: US09363626B2Publication Date: 2016-06-07
- Inventor: Wai-shing Tommy Chow , Wai-man Eden Ma , Chun-piu Lau
- Applicant: City University of Hong Kong
- Applicant Address: HK Kowloon
- Assignee: CITY UNIVERSITY OF HONG KONG
- Current Assignee: CITY UNIVERSITY OF HONG KONG
- Current Assignee Address: HK Kowloon
- Agency: Amin, Turocy & Watson, LLP
- Main IPC: H04L1/00
- IPC: H04L1/00 ; H04W4/00
Abstract:
Probabilities are trained herein to test a wireless network system based on normal and faulty node conditions. The probability information is then used to identify normal and faulty networks during testing, which generates an indication of faulty nodes or an indication of a normal transmission path.
Public/Granted literature
- US20150215155A1 DETERMINING FAULTY NODES WITHIN A WIRELESS SENSOR NETWORK Public/Granted day:2015-07-30
Information query
