- Patent Title: Detection of electromagnetic radiation using nonlinear materials
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Application No.: US14634307Application Date: 2015-02-27
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Publication No.: US09366576B2Publication Date: 2016-06-14
- Inventor: Harold Y. Hwang , Mengkun Liu , Richard D. Averitt , Keith A. Nelson , Aaron Sternbach , Kebin Fan
- Applicant: Massachusetts Institute of Technology , Trustees of Boston University
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: Cooley LLP
- Main IPC: G01J5/02
- IPC: G01J5/02 ; G01J5/28 ; G01J5/20 ; H01L31/09 ; G01J5/00

Abstract:
An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.
Public/Granted literature
- US20150285687A1 DETECTION OF ELECTROMAGNETIC RADIATION USING NONLINEAR MATERIALS Public/Granted day:2015-10-08
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